Torrent details for "Ahmad S., Blish II R. Purple Plague in Microelectronics 2025" Log in to bookmark
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Language:
None
Total Size:
70.5 MB
Info Hash:
C1BEB4528104619B4A706EE2EA404EA4D074F333
Added By:
Added:
March 1, 2026, 3:03 p.m.
Stats:
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(Last updated: March 1, 2026, 3:03 p.m.)
| File | Size |
|---|---|
| Ahmad S., Blish II R. Purple Plague in Microelectronics 2025.pdf | 70.5 MB |
Name
DL
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Size
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11.1 MB
[10
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2024-07-07
| Uploaded by indexFroggy | Size 11.1 MB | Health [ 10 /3 ] | Added 2024-07-07 |
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158.1 MB
[52
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2025-05-21
| Uploaded by andryold1 | Size 158.1 MB | Health [ 52 /21 ] | Added 2025-05-21 |
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12.3 MB
[37
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2025-07-16
| Uploaded by andryold1 | Size 12.3 MB | Health [ 37 /23 ] | Added 2025-07-16 |
NOTE
SOURCE: Ahmad S., Blish II R. Purple Plague in Microelectronics 2025
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COVER
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MEDIAINFO
Textbook in PDF format
Purple Plague in Microelectronics presents research on the phenomenon of purple plague from the earliest days to the present. The authors explain intricate scientific aspects to understand cause and effect of this reliability issue in microelectronics in a way that ensures the content is understandable to readers of various educational levels, novice to expert, while satiating the needs of the engineering personnel closely associated with work related to the gold-aluminum interfacial integrity. The discovery of void formation leading to porosity in the purple phase and the resulting joint failure is discussed, along with detailed analyses of the various phases, metallurgy characteristics, and diffusion phenomenon at the gold-aluminum interface. They provide detailed drawings, graphs, charts, models, and tables, which allow easy comprehension of concepts and phenomenon through visual aids. The book explains various methods for evaluating the quality and reliability of wire bond joints, highlighting the relative advantages of each approach. Techniques such as shear testing and bond resistance testing are discussed in detail. It also examines the role of ingredients used in packaging material and the gold wire itself, supported by relevant mathematical models
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